XRD Data Analysis in GSAS-II

About this course

This course offers a comprehensive introduction to X-ray Diffraction (XRD) data analysis using the General Structure Analysis System (GSAS). Participants will learn the fundamental principles of XRD, including data collection, processing, and interpretation. The course covers essential GSAS functionalities for phase identification, unit cell refinement, and crystal structure determination. Special emphasis will be placed on Rietveld refinement, a powerful technique for extracting precise crystallographic information from XRD data.Students will explore the theoretical background of Rietveld refinement and learn how to apply it to various materials. The course will provide detailed instructions on setting up and running refinements, interpreting refinement output, and assessing the quality of the results. Additional topics include addressing common challenges in XRD data analysis, such as dealing with preferred orientation and sample heterogeneity.By the end of the course, participants will be equipped with the skills necessary to perform accurate and reliable XRD data analysis for a variety of materials science applications. They will also gain a deeper understanding of the capabilities and limitations of GSAS and Rietveld refinement. This course is ideal for graduate students, researchers, and professionals in materials science, chemistry, physics, and related fields who seek to enhance their expertise in XRD data analysis using advanced software tools.With a focus on theoretical understanding and practical application, this course will prepare students to effectively utilize GSAS for their research projects, enabling them to achieve high-quality results in their XRD analyses.

Course objectives

• equip participants with skills for accurate XRD data analysis
• enhance understanding of GSAS and Rietveld refinement