Semiconductor Characterization
About this course
This specialization provides an overview of how semiconductors are characterized. After a review of semiconductor basics, the courses cover electrical, electron beam, ion beam, x-ray, and optical measurement techniques for semiconductor materials and devices. Topics covered include diodes, MOSFETs, microscopy, and spectroscopy. Skills in semiconductor characterization are important for many careers in electrical engineering, including the ever-changing field of electronic device manufacturing.
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- Who stands behind it
- 35/35
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- 16/20
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What you'll learn
- Perform electrical characterization of semiconductor devices including diodes and MOSFETs
- Apply electron beam, ion beam, x-ray, and optical measurement techniques to semiconductor materials
- Use microscopy and spectroscopy methods for semiconductor analysis
- Evaluate semiconductor materials and devices using industry-standard characterization approaches
Course objectives
- Understand fundamental semiconductor physics and device operation
- Develop practical skills in multiple semiconductor characterization methodologies
- Gain competency in measurement techniques relevant to electronic device manufacturing
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