Electron and Ion Beam Characterization
About this course
Electron and ion beams are widely used for both qualitative and quantitative analysis of semiconductor materials and devices. They can be used to image structures with sub-nm resolution and to provide information about elemental composition and dopant concentration. This course describes the fundamentals of electron and ion beam characterization and includes a project that analyzes the surface roughness of a solar cell.
75/100
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- What the provider tells you
- 24/45
- Who stands behind it
- 35/35
- How complete the listing is
- 16/20
Scores how much the provider publishes and who stands behind it — not how well it is taught.
What you'll learn
- understand electron and ion beam principles
- analyze semiconductor materials
- perform sub-nanometer imaging
- evaluate elemental composition and dopant concentration
- assess surface roughness of solar cells
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